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The IC design process in the past few years has changed significantly: currently verification encompasses a large portion of the effort. "Getting it right" is mandatory, not just for ASICs which have huge respin penalties for design bugs, but for Programmable Logic.
With Programmable Logic it is possible to use an early draft of the RTL design to synthesize and realize the design on an FPGA early on, fixing the bugs later.
The problem with this approach is that FPGA or ASIC testing by itself does not come close to the sophistication of modern test methods which utilize constrained random and directed tests.
By automating the verification process, the target Device Under Test (DUT) is bombarded with a large set of random stimuli which can find statistically unlikely combinations of events which could cause bugs and would almost never be uncovered by using only deliberate, directed tests.
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